File Format | PDF
File Size | 4.07 MB
Pages | 696
Language | English
Category | Software
|
Description: Today, digital
logic devices are common in products that impact public safety, including
applications in transportation and human implants. Accurate testing has become
more critical to reliability, safety, and the bottom line. Yet, as digital
systems become more ubiquitous and complex, the challenge of testing them has
become more difficult. As one development group designing a RISC stated,
"the work required to . . . test a chip of this size approached the amount
of effort required to design it." A valued reference for nearly two
decades, Digital Logic Testing and Simulation has been significantly revised
and updated for designers and test engineers who must meet this challenge.
Second Edition covers such key topics as:
* Binary
Decision Diagrams (BDDs) and cycle-based simulation
* Tester
architectures/Standard Test Interface Language (STIL)
* Practical
algorithms written in a Hardware Design Language (HDL)
* Fault
tolerance
* Behavioral
Automatic Test Pattern Generation (ATPG)
* The
development of the Test Design Expert (TDX), the many obstacles encountered and
lessons learned in creating this novel testing approach.
|
Digital Logic Testing and Simulation, 2e